Low Temperature Chambers – Halt/Hass Test – Halt/Hass Chamber – Halt/Hass Chamber – Highly Accelerated Life Tests ​

Halt Test – Halt/Hass Test – Highly Accelerated Life Tests – Halt Test Chamber – Halt Chambers

Hass Test Chambers – High Temperature Chambers – Low Temperature Chambers – Hass Test Chambers – Low Temperature Chambers

Highly Accelerated Life Tests – Hass Test Chambers – Halt/Hass Life Testing – High Temperature Chambers – Halt Chambers

TA5000 w/ Halt Test Chamber

ThermalAir Series of Halt Temperature Test Chambers

The ThermalAir TA5000 is a compact, portable bench top environmental heating and cooling HALT Test Chamber system.

Download the Datasheets

Halt Test Chamber

Highly Accelerated Life Test Chambers

Temperature Testing Range
Instead of taking your parts that need low temperature testing or high temperature testing, to an oven or environmental test chamber, our temperature HALT Test Chamber test system allows you to perform your halt test temperature profiling right where you need it – at your test bench, on your production floor or in your test laboratory.

The ThermalAir HALT/HASS Test Chambers systems are a  series of high capacity thermal air stream systems that are used for thermal Halt/Hass testing at high and low temperatures for performing temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature ranges from -80°C to +200°C

Halt Test Chamber System

Whether it’s environmental temperature testing, thermal profiling, temperature cycling, thermal shock, or test conditioning, ThermalAir Temperature Test Equipment can help with your temperature testing requirements

High Temperature Test Chambers

Halt/Hass Test Chambers

The ThermalAir TA-5000 products with a wide range of temperature testing capabilitiesThe ThermalAir TA-5000 products with a wide range of temperature testing capabilities. Bench top -40°C to +80°C applications to temperature cycling -100°C to +300°C environmental temperature test. The TA-5000 is used for temperature testing in engineering product development test labs and production test floors for semiconductor IC devices and all kinds of electronic – non-electronic components and other parts and assemblies.. Bench top -40°C to +80°C applications to temperature cycling -100°C to +300°C environmental temperature test. The TA-5000 is used for temperature testing in engineering product development test labs and production test floors for semiconductor IC devices and all kinds of electronic – non-electronic components and other parts and assemblies.

Environmental Temperature Test Enclosure
TA-5000A with Hood

Temperature Cycling Equipment with Test Chamber
TA-5000A with Clamshell & Flex Hose

High Temperature Chambers  – High Temperature Chambers  –  Halt/Hass Chamber – Halt Test Chamber –  Halt Test Chambers ​

ThermalAir Temperature HALT/HASS Chambers

MPI Thermal Systems provide an array of temperature testing capabilities to accommodate a variety of products requiring extreme environmental temperature testing. Bench top -40°C to +80°C applications to temperature cycling -100°C to +300°C environmental temperature test. Our thermal forcing systems are use for failure analysis in semiconductor IC devices and all types of electronic – non-electronic components and other parts and assemblies.

Highly Accelerated Life Test Chamber
TA-5000A Highly Accelerated
Temperature Testing System

Temperature Test System
TA-5000A HALT Test System
with Hood

Halt Test Chamber
TA-5000A Halt Test Chamber
with Flex Hose

HALT HASS Test Chamber
TA-5000B HALT HASS Test Chamber
with Flex Hose

System Performance

 

  • Airflow: High capacity 10 l/s (20 scfm) continuous airflow optimizes temperature transition rate and throughput.
  • Typical Temperature transition rate:
-55° to +125°C: approximately 10 seconds
+125° to -55°C: approximately 10 seconds
  • Temperature Control: Environment Air or External DUT sensing directly at the DUT case to ±1.0°C
  • Temperature control Sensor Ports: Type T or Type K thermocouple, and 100 ohm RTD
  • Temperature set, display and resolution: ±0.1°C
  • Temperature Accuracy: 1.0°C ( calibrated to NIST standard)
  • Remote interface ports: Four: IEEE-488, RS232C, SOT/EOT/SFF, And Ethernet, 4 USB-Type A, 1 USB-Type B, VGA, LAN, PLUS Auto Start Test & End of Test for automatic temperature cycling Hot-Cold-Amb. All this makes for simple control and service ability.

 

 HALT/HASS Test Chambers

MPI Thermal Test Chambers meet the demand for localized environmental temperature testing.

The ThermalAir temperature test equipment is used for thermal test of semiconductor,  automotive sensors,fiber optic components, microwave, hybrids, MCMs, PCBs or any type of electronic and non-electronic parts. Our temp cycle systems connect to your test setup to bring temperature test capabilities directly to your bench top or test station.

Temperature Test Chamber
Environmental Chamber Clamshell Model

Temperature Testing System
Environmental Chamber Hood Model

With quality construction, this innovative technology allows you to perform temperature simulation tests in situ, at a specific location, at your tester station, test bench, or directly on the unit under test.

Temperature Conditioning | Temperature Test Systems | Test Chambers | Thermal Shock | Temperature Forcing Systems | Environmental Stress Screening

Halt Test Chamber – Halt/Hass Chamber –  Highly Accelerated Life Tests – Halt Test Chamber –  Hass Test Chambers ​

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