TA5000 w/ Halt Test Chamber
ThermalAir Series of Halt Temperature Test Chambers
The ThermalAir TA5000 is a compact, portable bench top environmental heating and cooling HALT Test Chamber system.
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Highly Accelerated Life Test Chambers
Experience the ultimate convenience with our temperature HALT Test Chamber test system. Say goodbye to the hassle of transferring your parts to ovens or test chambers for temperature testing. Our innovative solution allows you to perform temperature profiling right where you need it – whether it’s on your test bench, production floor, or test laboratory.
The ThermalAir HALT/HASS Test Chambers systems are a series of high capacity thermal air stream systems that are used for thermal Halt/Hass testing at high and low temperatures for performing temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature ranges from -80°C to +200°C
Halt Test Chamber System
Whether it’s environmental temperature testing, thermal profiling, temperature cycling, thermal shock, or test conditioning, ThermalAir Temperature Test Equipment can help with your temperature testing requirements
Halt/Hass Test Chambers
The ThermalAir TA-5000 products with a wide range of temperature testing capabilitiesThe ThermalAir TA-5000 products with a wide range of temperature testing capabilities. Bench top -40°C to +80°C applications to temperature cycling -100°C to +300°C environmental temperature test. The TA-5000 is used for temperature testing in engineering product development test labs and production test floors for semiconductor IC devices and all kinds of electronic – non-electronic components and other parts and assemblies.. Bench top -40°C to +80°C applications to temperature cycling -100°C to +300°C environmental temperature test. The TA-5000 is used for temperature testing in engineering product development test labs and production test floors for semiconductor IC devices and all kinds of electronic – non-electronic components and other parts and assemblies.
TA-5000A with Hood
TA-5000A with Clamshell & Flex Hose
Hass Test Chambers – Halt/Hass Chamber – Halt/Hass Chamber – Low Temperature Chambers – Hass Test Chambers
ThermalAir Temperature HALT/HASS Chambers
MPI Thermal Systems provide an array of temperature testing capabilities to accommodate a variety of products requiring extreme environmental temperature testing. Bench to test chamber -40°C to +80°C applications to temperature cycling -100°C to +300°C environmental temperature test. Our thermal forcing systems are use for failure analysis in semiconductor IC devices and all types of electronic – non-electronic components and other parts and assemblies.
System Performance
- Airflow: High capacity 10 l/s (20 scfm) continuous airflow optimizes temperature transition rate and throughput.
- Typical Temperature transition rate: -55° to +125°C: approximately 10 seconds +125° to -55°C: approximately 10 seconds
- Temperature Control: Environment Air or External DUT sensing directly at the DUT case to ±1.0°C
- Temperature control Sensor Ports: Type T or Type K thermocouple, and 100 ohm RTD
- Temperature set, display and resolution: ±0.1°C
- Temperature Accuracy: 1.0°C ( calibrated to NIST standard)
- Remote interface ports: Four: IEEE-488, RS232C, SOT/EOT/SFF, And Ethernet, 4 USB-Type A, 1 USB-Type B, VGA, LAN, PLUS Auto Start Test & End of Test for automatic temperature cycling Hot-Cold-Amb. All this makes for simple control and service ability.
HALT/HASS Test Chambers
MPI Thermal Test Chambers meet the demand for localized environmental temperature testing.
The ThermalAir temperature test equipment is used for thermal test of semiconductor, automotive sensors,fiber optic components, microwave, hybrids, MCMs, PCBs or any type of electronic and non-electronic parts. Our temp cycle systems connect to your test setup to bring temperature test capabilities directly to your bench top or test station.
With quality construction, this innovative technology allows you to perform temperature simulation tests in situ, at a specific location, at your tester station, test bench, or directly on the unit under test.