Thermal Test Systems

ThermalAir Series of Temp Cycling Test Systems

The ThermalAir TA5000 is a compact, portable bench top environmental heating and cooling temp cycling chamber system.

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Temperature Testing Equipment

Thermal Test Systems

Temperature Testing Range
Instead of taking your parts that need temperature cycling to an oven or environmental test chamber, our temperature cycling chamber test system allows you to perform your thermal test temperature profiling right where you need it – at your test bench, on your production floor or in your test laboratory.


The ThermalAir thermo cycling test systems are a  series of high capacity thermal air stream systems that are used for thermal testing, fast temperature cycling and device thermo test cycling of components, hybrids, modules, PCBs, BGAs, CSPs, and other electronic and non-electronic assemblies at precise temperature ranges from -90°C to +225°C

ThermalAir Temp Cycling Testing Systems

The ThermalAir TA-5000 products with a wide range of temperature cycling test capabilities. Bench top -40°C to +80°C applications from temperature cycling -100°C to +300°C environmental test. The TA-5000 is used for temperature cycling testing in engineering product development test labs and production test floors for semiconductor IC devices and all kinds of electronic – non-electronic parts and assemblies.

Temperature Cycling Test System | Thermal Test Chamber | Thermal Profiling Test Systems

TA-5000A w/ Glass Cap

Temperature Cycling Test Chamber| Thermal Test Chamber | Thermal Profiling Test Chamber

TA-5000A w/ Clamshell Test Chamber

Temperature Cycling Test Enclosure| Thermal Test Enclosure| Thermal Profiling Test Enclosure

TA-5000A w/ Thermal Test Enclosure

Advanced Thermal Test Solution | Temperature Testing System | Temperature Stress Testing System

TA-5000A w/ Thermal End Effectors

Specification Features & Benefits

  • Ultra Cold Temperatures maintained at 50&60Hz
  • Dual Touch Screens Front Panel & Thermal Head
  • Plug-in anywhere from 200~250VAC, 1Ø
  • ECO Smart DC system for up to 50% energy saving
  • No voltage configuration to use at different locations
  • Versatile Boom & Stand – Extended reach standard
  • SSD for thermal file management and data logging
  • Control Heated dry air purge for frost free operation
  • One touch Temp Cycle, Ramp, Soak and Dwell
  • Ultra low audible noise for quiet engineering lab use

Environmental Temperature Testing Chamber - Temperature Test Systems and Thermal Test System

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System Performance


  • Airflow: High capacity 10 l/s (20 scfm) continuous airflow optimizes temperature transition rate and throughput.
  • Typical Temperature transition rate:
-55° to +125°C: approximately 10 seconds
+125° to -55°C: approximately 10 seconds
  • Temperature Control: Environment Air or External DUT sensing directly at the DUT case to ±1.0°C
  • Temperature control Sensor Ports: Type T or Type K thermocouple, and 100 ohm RTD
  • Temperature set, display and resolution: ±0.1°C
  • Temperature Accuracy: 1.0°C ( calibrated to NIST standard)
  • Remote interface ports: Four: IEEE-488, RS232C, SOT/EOT/SFF, And Ethernet, 4 USB-Type A, 1 USB-Type B, VGA, LAN, PLUS Auto Start Test & End of Test for automatic temperature cycling Hot-Cold-Amb. All this makes for simple control and service ability.


Temp Cycling Testing Chambers

MPI Thermal Test Chambers meet the demand for localized environmental temptesting.

The ThermalAir therno test equipment is used for temp test of semiconductor,  automotive sensors,fiber optic components, microwave, hybrids, MCMs, PCBs or any type of electronic and non-electronic parts. Our temp cycle systems connect to your test setup to bring temperature test capabilities directly to your bench top or test station.

Environmental Chamber
Temp Cycling Test w/ Chamber Clamshell 

Environmental Test Chamber
Thermo Cycling Test Chamber Hood 

With quality construction, this innovative technology allows you to perform temperature simulation tests in situ, at a specific location, at your tester station, test bench, or directly on the unit under test.

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