Benchtop Temperature Chambers
Whether you’re testing Semiconductor IC devices, automotive sensors, fiber optic components, microwave hybrids, MCMs, PCBs or any type of electronic and non-electronic parts, we can connect to your test setup to bring thermal test capabilities directly to your bench top or test station
An Evolution in Environmental Test Cycling Chambers
-60°C to +200°C
Download the Datasheets
Performance
Temperature Change Rate (in seconds)
Ambient to +125°C < 8 minutes
+125°C to Ambient < 8 minutes
-40°C to Ambient < 3 minute
Ambient to -40°C < 11 minutes
Uniformity 2.0°C range from setpoint
*Temperature Performance is dependent on output air flow of TA-5000A/B
Benchtop Temperature Forcing System – Thermal Cycle Chamber – Temperature Chambers – Benchtop Test Chamber – Chamber Test
Benchtop Temperature Test Chamber
The Clamshell Compact Test Chamber can be open and closed for quick and easy loading/unloading of your parts that need temperature testing and thermal conditioning. Temperature test your electronic/non-electronic parts and other devices at temperatures from -60°C to +200°C with temperature accuracy and uniformity unmatched by large environmental chambers.
The ThermalAir TA-5000 systems provide temperature directly to the test application. The Clamshell Style compact test chamber in standard and custom dimensions for many size devices and components in Aerospace, Semiconductor, RF Microwave, Automotive electronic, Fiber Optic and other Test Articles.
Our new thermal test technology gives the end user the ability to easily test while controlling the ramp rate speed with one-touch temperature set point functions.
Download the Datasheets
Benchtop Temperature Controlled Chamber – Opens and Closes Easily
-60°C to +200°C
The MPI ThermalAir Benchtop Temperature Test Chamber is an Adaptable
Benchtop Temperature Test Chamber
The ThermalAir TA-5000 systems provide temperature directly to the test application. The Clamshell Style compact test chamber in standard and custom dimensions for many size devices and components in Aerospace, Semiconductor, RF Microwave, Automotive electronic, Fiber Optic and other Test Articles.
Our new thermal test technology gives the end user the ability to easily test while controlling the ramp rate speed with one-touch temperature set point functions.
Compact BenchTop Test Chamber
Thermal Testing for different types of applications
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