Localized Environmental Test Chambers
Whether you’re testing Semiconductor IC devices, automotive sensors, fiber optic components, microwave hybrids, MCMs, PCBs or any type of electronic and non-electronic parts, we can connect to your test setup to bring thermal test capabilities directly to your bench top or test station
An Evolution in Environmental Test Chambers
The MPI ThermalAir Temperature Cycling Chamber
Environmental Test Chambers
Compact Bench Top Environmental Test Chambers – Temperature Cycling Chambers for all types of Applications
ThermalAir Environmental Test Chamber can be raised up and lowered down over your device under test. Temperature cycle your electronic and non-electronic components and other parts temperature range from -60°C to +200°C with temperature uniformity unmatched by large thermal test chambers.
Performance
Temperature Cycling Rate
Ambient to +125°C < 8.0 minutes
+125°C to Ambient < 8.0 minute
-40°C to Ambient < 3.0 minutes
Ambient to -40°C < 11.0 minutes
Uniformity 2.0°C at the set point temperature
* Temperature performance is dependent on output air flow of TA-5000A/B
Whether you’re temperature cycling semiconductor devices, automotive sensors, fiber optic components, microwave hybrids, MCMs, PCBs or any type of electronic and non-electronic parts, our environmental test chamber can bring temperature cycling test capabilities directly to your bench top or test station
Thermal Test Chambers – Thermal Test Chambers – Test Chambers – Temperature Cycling Test – Temperature Testing Chamber
Thermal Testing Chamber – Thermal Test Chamber – Temperature Test Chambers – Thermal Test Chambers – Temperature Testing Chamber
